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Thin layer - substrate system analysis

Citace: [] SOSNOVÁ, M., KŘÍŽ, A. Thin layer - substrate system analysis. In Juniormat '05. Brno: University of Technology, 2005. s. 43-46. ISBN: 80-214-2984-4
Druh: STAŤ VE SBORNÍKU
Jazyk publikace: eng
Anglický název: Thin layer - substrate system analysis
Rok vydání: 2005
Místo konání: Brno
Název zdroje: University of Technology
Autoři: Martina Sosnová , Antonín Kříž
Abstrakt CZ: Hlavním důvodem použití tenkých vrstev na řezných nástrojích je zvýšení jejich životnosti a optimalizovat proces obrábění.
Abstrakt EN: Main goal of thin layers deposited on cutting tools is to increase their cutting efficiency and optimize the machining process itself. Laboratory tests of system thin film - substrate have so far certain given limited ability about application qualities of the whole system. Therefore after laboratory tests follow practical tests. Material analysis and basic laboratory tests were chosen to analyse thin layer-substrate system properties (tribological test "PIN-on-DISC", scratch test, fractography, indentation test, GD-OES, microhardness). Correlation between laboratory and practical tests and direct linking to parameters of deposition enable decrease in material consumption, financial costs and increase in tool life. Practical tests enable determination of not only final cutting edge durability, but also the mechanisms of its degradation. Following achieved results of the tests it is also possible to look for optimal cutting conditions, change in tool geometry etc.
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