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Analysis of total hemispherical emissivity of samples with a thin film and a protective film

Citace:
MARTAN, J., HONNEROVÁ, P. Analysis of total hemispherical emissivity of samples with a thin film and a protective film. Frentech Aerospace s.r.o., 2014.
Druh: ZPRÁVA
Jazyk publikace: eng
Anglický název: Analysis of total hemispherical emissivity of samples with a thin film and a protective film
Rok vydání: 2014
Název zdroje: Frentech Aerospace s.r.o.
Autoři: Ing. Jiří Martan Ph.D. , Ing. Petra Honnerová Ph.D.
Abstrakt EN: In the present work there is described development of measurement method of total hemispherical emissivity based on spectral reflectivity measurement by means of FTIR spectrometer for polished samples with a thin film and a protective film (combination of diffuse and specular methods). Emissivities of samples with different protective coatings were analysed. Measurements were analysed, best candidates were chosen and recommendations were made for the space program.
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