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Using VHDL-AMS to simulate aging behavior of electronic components

Citace:
GEORGIEV, V., HOFMANN, G. Using VHDL-AMS to simulate aging behavior of electronic components. In International Conference on Applied Electronics (AE 2016) : proceedings. Piscataway: IEEE, 2016. s. 89-92. ISBN: 978-80-261-0601-2 , ISSN: 1803-7232
Druh: STAŤ VE SBORNÍKU
Jazyk publikace: eng
Anglický název: Using VHDL-AMS to simulate aging behavior of electronic components
Rok vydání: 2016
Místo konání: Piscataway
Název zdroje: IEEE
Autoři: Doc. Dr. Ing. Vjačeslav Georgiev , Gerhard Hofmann
Abstrakt EN: Reliability of electronics is in the automotive industry very important. The average age of cars in Germany was 9 years at 2015.i Normally the life time is evaluated by the environmental test according ISO 16750. The content of this paper is to contribute that computer simulation of aging is a possible way to evaluate electronic circuits in the define phase. For this reason a VHDL-AMS simulation models is used to model aging behavior of a resistor.
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